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IEEE P 1671™/DA

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Draft
Standard for Standard Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

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of the

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Copyright © 2005 by the Institute of Electrical and Electronics Engineers, Inc.

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Copyright © 2005 IEEE. All rights reserved.
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April 27, 2005 IEEE P1671/DA

Introduction

Mission Statement

To define a collection of XML schemas that allows ATE and test information to be exchanged in a common format adhering to the XML standard.

Goals

·  Establish an industry standard for test information exchange

·  An exchange format that can be understood by man or machine

·  Allow and design for user extensibility

·  Establish a process for managing extensibility

·  Ensure acceptance within the user community

General Use Cases

·  Dynamic test sequences that can change with historical data

·  Support instrument setup directly

·  Support instrument setup using signal descriptions

·  Support parallel/simultaneous testing and complex timing relationships

·  Capture test results

·  Capture test program information and sequencing

·  Capture instrument specifications and capabilities

·  Capture test station specifications and capabilities

·  Capture test setup and test configurations

·  Capture Unit Under Test (UUT) specifications and requirements

·  Capture test support hardware & software

·  Capture UUT diagnostic and maintenance information

ATML usage

The ATML initiative has come about by a desire to standardize on the XML format used by various proprietary tools used within the test industry. By using a common format different tools and systems can exchange information, and be brought together to form co-operative heterogeneous systems which, through the use of ATML standardization can:

·  Decrease test times

·  Reduce incidents of Can Not Duplicate or No Fault Found

·  Reduce the Repair Cycle

·  Formalize the capture of historic data which has been the preserver of experts in the field to heuristically identify faulty components.

·  Close the loop on diagnostic systems

Philosophy

This is not want you think but something else instead. This document identifies the requirement of the components needed to satisfy ATML where each component standard identifies how it fulfils these requirements and design aims.


At the time this standard was completed, the working group had the following membership:

<insert name of chair(s) here>, Chair

Copyright © 2005 IEEE. All rights reserved.
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April 27, 2005 IEEE P1671/DA

<member 1>

<member 2>

<member 3>

Copyright © 2005 IEEE. All rights reserved.
This is an unapproved IEEE Standards Draft, subject to change. ii

April 27, 2005 IEEE P1671/DA

The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. (To be provided by IEEE editor at time of publication.)

Contents

Introduction ii

Mission Statement ii

Goals ii

General Use Cases ii

ATML usage ii

Philosophy ii

1 Overview 5

1.1 Scope 5

1.2 Purpose 6

1.3 Conventions used in this document 6

2 References 6

3 Definitions and acronyms 6

3.1 Definitions 6

3.2 Abbreviations 7

4 ATML System Framework 7

4.1 External Interfaces 7

4.2 Web Services 8

4.3 Web Service Description Language (WSDL) 9

5 ATML Component Schemas 9

5.1 Common 10

5.2 Test Results 10

5.3 Diagnostics 10

5.4 Test Description 11

5.5 Instrument 12

5.6 Test Configuration 12

5.7 UUT Data 12

5.8 Test Station 13

5.9 Interface Adapter 13

6 ATML Standard and Conformance 13

Annex A (informative) Style Guidelines 15

A.1 Naming Conventions 15

A.2 Naming Guidelines 15

A.3 XML Declaration 15

A.4 ATML Namespaces 16

A.5 Versioning 17

A.6 Documentation 17

A.7 Element versus Type 17

A.8 Design 18

A.9 Element versus Attribute 18

A.10 Extensibility 18

A.11 Defining Uniqueness and References 18

Copyright © 2005 IEEE. All rights reserved.
This is an unapproved IEEE Standards Draft, subject to change. ii

April 27, 2005 IEEE P1671/DA

IEEE Standard for Standard Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

1  Overview

1.1  Scope

ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the extensible markup language (XML). This document specifies the architecture for the family of ATML standards.

1.2  Purpose

The purpose of ATML is to support test program, test asset and Unit Under Test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidance for usage of the ATML family of standards.

1.3  Conventions used in this document

2  References

Uniform Resource Identifiers (URI): Generic Syntax. Internet Engineering Task Force RFC 2396 August 1998 [cited 2000-08-07]. Available from World Wide Web: <http://www.ietf.org/rfc/rfc2396.txt>.

URN Syntax. Internet Engineering Task Force RFC 2141 May 1997 [cited 2000-09-28]. Available from World Wide Web: <http://www.ietf.org/rfc/rfc2141.txt>.

Extensible Markup Language (XML) 1.0. World Wide Web Consortium Recommendation 4 February 2004 [cited 2000-05-05]. Available from World Wide Web: <http://www.w3.org/TR/2004/REC-xml-20040204/>.

Namespaces in XML. World Wide Web Consortium Recommendation 14 January 1999 [cited 2000-05-05]. Available from World Wide Web: <http://www.w3.org/TR/1999/REC-xml-names-19990114/>.

XML Information Set World Wide Web Consortium Candidate Recommendation 24 October 2001 [cited 2004-05-05]. Available from World Wide Web: <http://www.w3.org/TR/2004/REC-xml-infoset-20040204/>.

XML Linking Language (XLink) Version 1.0. World Wide Web Consortium Candidate Recommendation 3 July 2000 [cited 2004-05-05]. Available from World Wide Web: <http://www.w3.org/TR/2001/REC-xlink-20010627/>.

XML Path Language (Xpath) Version 1.0. World Wide Web Consortium Recommendation 16 November 1999 [cited 2003-05-12]. Available from World Wide Web: < http://www.w3.org/TR/xpath/>.

XML Schema Part 1: Structures. W3C Recommendation, 2 May 2001 [cited 2004-05-05]. Available from World Wide Web: <http://www.w3.org/TR/xmlschema-1/>.

XML Schema Part 2: Datatypes. W3C Recommendation, 2 May 2001 [cited 2004-05-05]. Available from World Wide Web: < http://www.w3.org/TR/xmlschema-2/>.

3  Definitions and acronyms

The following terms and acronyms are used within this standard.

3.1  Definitions

element: A bounded component of the logical structure of an XML document that has a type and that may have XML attributes and content [adapted from XML 1.0 Recommendation].

markup declarations: XML element type, XML attribute-list, XML entity and XML notation declarations that provide a grammar for a class of XML documents.

schema instance: An information set, grouped for some purpose, that is governed by a single ATML schema.

XML attribute: Name-value pair associated with an XML element.

XML document: A (text) data object that conforms to the XML requirements for being well-formed.

3.2  Abbreviations

URI Uniform Resource Identifier

URN Uniform Resource Name

XML Extensible Markup Language

4  ATML System Framework

The ATML framework is defined in the form of two distinct approaches.

·  External interfaces

·  Web Services

Within this framework the External interfaces define domain orientated information that are used by Web Services. The information should always reference to the UUT or Repair process. The framework also defines, Web Services to generate, consume and manipulate this information.

The key framework point is that ATML is about information modeling, where the information models are expressed in XML

Extensibility is the driving focus for ATML initiative and is a key objective.

ATML is more than a minimum sub-set for today's knowledge, but the ATML Schemas concentrate on that common subset of information.

The ATML framework defines the components from which users can build their architectures, whilst being interoperable with other compliant architectures

4.1  External Interfaces

External Interfaces represent the information that exchanges between two distinct subsystems. For ATML these subsystems are defined as:

·  Test Results

·  Diagnostics

·  Test Description

·  Instrument

·  Test Configuration[1]

·  UUT Data

·  Test Station

·  Interface Adapter

This information shall be representable in XML and defined through the use of XML Schema Document (XSD) conforming to the XMLSchema specification

The relationship between the various components of ATML and a “generic” ATE is depicted in the following diagram.

Figure 1 - ATML generic ATS Subsystems

4.2  Web Services

It is recognized within ATML that definition of the External Interfaces are generally not enough to enforce heterogeneous co-operative ATS systems. A simple scenario of “Tell me your Test Configuration?” or “What is the next Diagnostic?” require that we not only define the format of the information exchange but we can standardize on how the questions should be asked.

The Web Services infrastructure is founded on communication via XML-based messages that comply with a published Web Service description. The service description is an XML document written in an XML grammar called WSDL (Web Service Description Language) that defines the format of messages the Web Service understands. The service description serves as an agreement that defines the behavior of a Web Service and instructs potential clients in how to interact with it.

Where ATML components need to define such services, these shall be defined using WSDL.

4.3  Web Service Description Language (WSDL)

WSDL describes a Web service in two fundamental stages: one abstract and one concrete. Within each stage, the description uses a number of constructs to promote reusability of the description and separate independent design concerns.

At an abstract level, WSDL describes a Web service in terms of the messages it sends and receives; messages are described independent of a specific wire format using a type system, typically XML Schema.

An operation associates a message exchange pattern with one or more messages. A message exchange pattern identifies the sequence and cardinality of messages sent and/or received as well as who they are logically sent to and/or received from. An interface groups together operations without any commitment to transport or wire format.

At a concrete level, a binding specifies transport and wire format details for one or more interfaces. An endpoint associates a network address with a binding. And finally, a service groups together endpoints that implement a common interface.

5  ATML Component Schemas

Each ATML component is supported by a set of documents based upon the ATML IEEE Document Template, which shall contain:

·  An ATML Requirement and Use case specification section in the ‘ATML Requirements and Use Cases’ covering each component plus cross-reference to Use cases.

·  ATML Schema Specification containing support information, requirements, use cases etc. (.doc)

·  XML Schema (.xsd) for defining information content

·  WSDL Service definition for defining component Web Services

The process for submitting a draft schema or description document is that there shall be an associated candidate ATML requirement and use case specification for the component.

The main XML document is defined by the following table and represents the document types that all test information should use to be transmitted.

The ATML Component Schemas shall be a version controlled item and have a meaningful name with description and versions. The ATML components represent only items that could be instantiated in a document type or used as a sub element of another element. With the exception of the ATMLCommon schema a maximum of one root element definition per .xsd file. Each of the ATML sections shall represent a single entity with a top level node describes as follows:

  1. Common
  2. Test Results –contains a single run of test results
  3. Diagnostics – describes a signal diagnostic entity
  4. Test Description – describes a test program
  5. Instrument – describes one instrument
  6. Test Configuration – describes the configuration for testing
  7. UUT Data – describes a UUT
  8. Test Station – describes one Test Station configuration
  9. Interface Adaptor– describes one test adaptor

5.1  Common

5.1.1  Scope

Throughout ATML, there are types (complex and simple) and attribute groups that are shared among schemas. The Common sub-schema will contain these types. Additions to Common shall be made when components are identified as being used in multiple schemas.

5.1.2  Purpose

Any item that is used or may be used in more than one ATML sub-schema will be defined in the ATML Common schema. ATML Common shall contain only type or attribute group definitions and shall not include any elements definitions. There may be components included in the Common schema but not used in multiple ATML documents. Such components are included based on a determination that they may be shared across ATML sub-schemas. Common components are equivalent to common data types. Inclusion of Common in another sub-schema shall use a defined namespace to clearly identify different extensions.

5.2  Test Results

5.2.1  Scope

The Test Results schema is the source schema for all instance documents that will contain test results for a unit under test or for calibration of an ATE. Test Result instance documents will be the required format for data transfer between systems, and may be used as a data storage format, as desired by the user.

5.2.2  Purpose

The Test Results schema provides a standard format for publishing test results. This will permit such data to be easily shared for a variety of purposes, including statistical analysis and diagnostics. To provide a single source for the essential information about a test, the Test Results schema provides data elements to capture identifying information for: the UUT, the test station, the test program (via reference to a Test Description document); ambient environmental conditions at the time of the test, test equipment calibration data, test program input data (i.e. parameters) and ancillary textual comments.