CORRELATIVE XRM AND SEM MANDATORY SPECIFICATIONS LISTANNEXURE A9

Name of supplier: ______

Tenderers complete this table with specifications according to the configuration of the equipment that they propose to supply:

CORRELATIVE XRM AND SEM / TECHNICAL SPECIFICATIONS / Specification of proposed machine / Comments
A / Correlative Equipment
1. / Correlative system configuration / The system must consist of an XRM machine and an SEM machine that are designed to for correlative work.Give proof of correlative work using this system. (YES / NO)
System must have the capability to incorporate other machines including optical microscopes (inverted, stereo), light microscopes (confocal, Widefield) and electron microscopes (FIB-SEM) for future upgrade (YES / NO)
2. / Correlation software / Software for combining images from a number of instruments and from different sessions in one workspace. (YES / NO)
Software for manipulating image images including stitching, selecting regions of interest and blending (YES / NO)
3. / Advanced training / Training on all special features and capabilities ofsystem. (YES / NO)
XRM Instrument
4. / XRM equipment / XRM designed for correlation with SEM, FIB-SEM, Light microscopes and capability of multiple contrast modes: 1) absorption, 2) phase propagation, 3) diffraction. (YES / NO)
Perform 4D analysis, that is evolution of 3D grain structure over time
(YES / NO)
Perform surface reconstruction for 2D 3D and 4D image analysis including visualisation and measurement of properties including areas, volumes, counts, distributions and orientations(YES / NO)
Investigate fracture and other effects of in-situ heating, cooling, tension and compression on a sample (YES / NO)
5. / X-Ray Source / Power rating: / W
Tube voltage rating: / kV
6 / Auto-Filter changer / Number of filters: / Filters
7. / Resolution / Spatial resolution: / μm
Voxel size (nominal resolution or detail detectability): / μm
8. / Sample stage / Load capacity: / kg
Sample dimension (dia x h): / xmm
9. / In-situ stage for testing under thermo-mechanical loading / Tensile / compressive load: / kN
Temperature range: / 0Cto 0C
Resolution for in-situ stage at 50 mm working distance: / μm
10. / Detector(s)
(should consist of a camera and one or more objectives / Large field of view camera(YES / NO)
One or more objectives: (YES / NO)
SEM Instrument
11 / SEM / SEM designed for correlation with XRM, LM (YES / NO)
12 / SEM Accessories / Fitted with STEM detector (YES / NO)
Fitted with EDS detector (YES / NO)
Fitted with EBSD detector (YES / NO)
13 / Resolutions / At 30 kV SE: / nm
At 30 kV SE with variable pressure: / nm
At 3 kV SE: / nm
At 1 kV SE: / nm
14 / Magnification / Magnification range: / x to x
15 / Voltage / Accelerating voltage rating: / kV
16 / Current / Probe current rating: / μA
17 / Variable pressure / Low vacuum pressure range up to: / Pa
18 / Sample stage / Load capacity: / kg
Sample dimension (diameter x height): / xmm
19 / detectors / Secondary Electron Detector(YES / NO)
Variable Pressure Secondary Electron Detector(YES / NO)
High Definition Backscattered Electron (YES / NO)
Cathodoluminescence Detector (YES / NO)
CHAMBERSCOPE CCD camera(YES / NO)
20 / PC for SEM / Quad-core or better, 2 x 4 TB plus 480 GB SSD, 2GB video, 8GB RAM or better
21 / PC monitors / 2 Monitors

Signature: ______Date:______