TEST procedure
FOR Slac’s
PDU
Date of issue: July 7, 2005
PREPARED FOR:David Nelson, MS 96
Phone: (650) 926-4257
Stanford Linear AcceleratorCenter (SLAC)
P.O. Box 20450
Stanford, CA94309
P.O. No: 0000056078
W.O. No: 83489
Doc. No: TP05-83489-0 / PREPARED BY:
Chuck Kendall
Senior EMC Consultant
CKC Laboratories, Inc.
5473A Clouds Rest
Mariposa, CA 95338
This report contains a total of 80 pages and may be reproduced in full only. Partial reproduction may only be done with the written consent of CKC Laboratories, Inc.
Table of Contents
1.0 INTRODUCTION
1.1 Purpose
1.2 Equipment To Be Tested
1.3 Description of Unit Under Test
1.4 Test Objectives
1.5 Test Sequence
1.6 Acronyms and Abbreviations
2.0 APPLICABLE DOCUMENTS
3.0 DESCRIPTION OF TEST SITE
3.1 Test Facilities
3.2 Ground Plane
3.3 Mounting and Bonding
3.4 Test Facility Radiated and Conducted Emission Profile
3.5 Test Instrumentation Isolation
3.6 General Emission Testing Requirements
3.7 General Susceptibility Testing Requirements
4.0 TEST INSTRUMENTATION
5.0PDU SETUP FOR TEST
6.0PDU OPERATION DURING TEST
6.1 Critical Frequencies
6.2 Modes of Operation
6.3 Susceptibility Pass/Fail Criteria
6.4 Susceptibility Failure Data Recording
6.5 Test Report
7.0 EMC/EMI MEASUREMENTS
7.1 CE102 Test Setup and Procedure Test Method , Conducted Emission, 10 kHz to 10 MHz for all Power Leads including returns.
7.2 Equipment Conducted Emissions, Common Mode (CECM) Test
7.3 CS102 Test Setup and Procedure Test Method , Conducted Susceptibility, 10 kHz to 10 MHz for all Power Leads not including
7.4 CSCM Conducted Susceptibility, Common Mode,
30 Hz to 150 MHz
7.5 CS06 Conducted Susceptibility, Spike, Power Leads
7.6 RE101 Test Setup and Procedure Test Method , Radiated Emissions, Magnetic Field 10 Hz to 100 kHz.
7.7 RE102 Test Setup and Procedure Test Method , Radiated Emissions, Electric Field 10 kHz to 18 GHz.
7.9 RS103 Test Setup and Procedure Test Method , Radiated Susceptibility, Electric Field, 30 MHz to 18 GHz.
8.0SAFETY CONSIDERATIONS
9.0 EMC POST-TEST PROCEDURES
10.0 TEST DATA RECORDS
11.0 TEST CERTIFICATION
1.0 INTRODUCTION
This Qualification Test Procedure identifies the requirements and test procedures required to meet the requirements of Data Item DI-EMCS-80201. The procedure will verify the Electromagnetic Control (EMC)of the PDU
This procedure will be performed at 1120 Fulton Place, Fremont, CA94539.
All operational tests performed on the PDU before, during and after the environmental tests to determine how well the PDU performs under simulated environmental conditions will be performed by SLAC personnel using SLAC test equipment in accordance with this SLAC test procedures. Only SLAC personnel shall connect and power on EUT and Support equipment. All tests performed in accordance with this Procedure are subject to inspection by SLAC representatives.
1.1Purpose
The purpose of this test procedure for the PDU is to provide recorded data for a report to insure that the PDU (the System) meets the requirements of the Design Control Specification. The specific MIL-STD-461C/MIL-STD-461E requirements as modified by the Statement of Work, document LAT-PS-05397-01.
1.2Equipment To Be Tested
The PDU equipment to be tested by this procedure shall consist of the following:
EUT:
PDU, LAT-DS-01743-03
Cable, LAT-DS-06783 GASU – PDU
Cable, LAT-DS-06782 PDU – Power
SUPPORT EQUIPMENT:
VME Crate
28 VDC Power Supply
Computer
Line Conditioner
1.3Description of Unit Under Test
The PDU assembly is an electronic interface of the Tower assembly.
In the text and drawings that follow, the PDU will sometimes be referred to as EUT (Equipment Under Test) or UUT (Unit Under Test).
1.4Test Objectives
The objectives of the tests described herein are to assure that:
(a)While operating under spacecraft representative loading, no excessive conducted emissions in the range of 10 kHz to 10 MHz appear on the power input leads of the PDU when operating from its applicable 28VDC power source of the PDU. The CE102 and CECM tests are used to verify compliance with MIL-STD-461E.
.
(b)The PDU is not susceptible to interference from signals injected on its input power leads and interconnecting signal leads over the range of DC to 150 MHz when powered by its applicable 28VDC power source. The CS102 and CSCM procedures are used to verify compliance with LAT-MD-00408 and LAT-SS-00778.
(c)The PDU is not susceptible to interference from power line transients such as might be induced from damped sinusoid transients on the power lines when powered by its applicable 28VDC power source. The CS06 procedure is used to verify compliance with LAT-MD-00408 and LAT-SS-00778.
(d)The PDU does not produce radiated emissions which could interfere with other nearby equipment over the range of 20 Hz to 18 GHz when powered by its applicable 28VDC power source. The RE101 and RE102 procedures are used to verify compliance with LAT-MD-00408 and LAT-SS-00778.
(e)The PDU is not susceptible to magnetic induction fields applied to the equipment case when powered by its applicable 28VDC power source. The RS101 procedures are used to verify compliance with MIL-STD-461E.
(f)The PDU is not susceptible to interference when immersed in a radio frequency field over the range of 30 MHz to 18 GHz. The RS103 procedures are used to verify compliance with LAT-MD-00408 and LAT-SS-00778 when operating from its applicable 28VDC power source.
1.5Test Sequence
The tests described herein may be performed in any convenient order.
1.6Acronyms and Abbreviations
A/CAircraft
ATPAcceptance Test Procedure
BBBroadband
BITBuilt-In-Test
BWBandwidth
CEConducted Emissions
CSConducted Susceptibility
cwContinuous Wave
dBADecibels above one Microamp
dBA/MHzDecibels above one Microamp per Megahertz
dBVDecibels above one Microvolt
dBV/mDecibels above one Microvolt per Meter
dBV/m/MHzDecibels above one Microvolt per Meter per Megahertz
DCDirect Current
EMCElectromagnetic Compatibility
EMIElectromagnetic Interference
EUTEquipment Under Test
HzHertz
IBWImpulse Bandwidth
IAWIn Accordance With
I/OInput/Output
IUInterface Unit
LITLightning
LISNLine Impedance Stabilizing Network
FMicrofarad
mOhmsMilliohms
N/ANot Applicable
NBNarrowband
P/NPart Number
PPSPulse Per Second
PRRPulse Repetition Rate
RERadiated Emissions
RFRadio Frequency
rmsRoot Mean Square
RSRadiated Susceptibility
SASpectrum Analyzer
SMAShock Mount Assembly
TBDTo Be Determined
TEMTower Equipment Module
TPSTower Power Supply
UUTUnit Under Test
V/mVolts Per Meter
2.0APPLICABLE DOCUMENTS
The following documents form a part of this procedure to the extent specified herein. In the event of a conflict between a document and the detailed content of this Test Procedure, the detailed content of this procedure will be considered as a superseding requirement unless it conflicts with the Design Control Specification listed herein.
2.1Applicable Documents:
2.2Standards Military
MIL-STD-461EElectromagnetic Emission and
Susceptibility Requirements for the Control of Electromagnetic Interference
MIL-STD-462EElectromagnetic Interference
Characteristics, Measurements of
MIL-STD-464AElectromagnetic Environmental Effects Requirements for Systems
MIL-STD-45662Calibration Systems Requirements
2.3Design Specifications, Handling and Acceptance Test Procedures
433-RQMT-0005, Rev AGLAST Observatory Electromagnetic Interference (EMI) Requirements Document, NASA/GSFC, Oct 6, 2003
LAT-MD-00408“LAT Instrument Performance Verification Plan”, SLAC, W. Davis.
LAT-SS-00778“LAT Environmental Specification”, SLAC, M. Nordby.
TABLE 2-1
ELECTROMAGNETIC INTERFERENCE TEST REQUIREMENTS
Test / MIL-STD-461E orother
REFERENCE / TEST PLAN
PARA.
NO. / DESCRIPTION / MODIFICATIONS
1 / CE102 / 7.1 / Conducted Emissions, Power Leads, 10 kHz to MHz / MIL-STD-462, CE03
2 / CECM / 7.2 / Conducted Emissions, Common Mode, DC to 150 MHz / Custom
3 / CS102 / 7.3 / Conducted Susceptibility, Power Leads, 10 kHz to 10 MHz / MIL-STD-462, notice 5, CS02
4 / CSCM / 7.4 / Conducted Susceptibility, Common Mode, DC to 150 MHz / MIL-STD-461E, CS114
5 / CS06 / 7.5 / Conducted Susceptibility,
Spikes on Power Leads / MIL-STD-462, notice 3, CS06, Figure CS06-2
6 / RE101 / 7.7 / Radiated Emissions, Magnetic Field, 20 Hz to 50 kHz / MIL-STD-461E, RE101
7 / RE102 / 7.8 / Radiated Emissions, Electric Field, 10 kHz to
18 GHz / MIL-STD-461E, RE102
8 / RS101 / 7.9 / Radiated Susceptibility, Magnetic Field, 20 Hz to 50 kHz / MIL-STD-461E, RS101
9 / RS103 / 7.10 / Radiated Susceptibility, Electric Field, 30 MHz to
18 GHz / MIL-STD-461E, RS103**
Note: When the required method in this table calls for the use of a Line Impedance Stabilization Network (LISN), it shall be replaced by a 10 micro-
Farad feed-through capacitor (often referred to as LSC) connected from power-to-ground and return-to-ground.
** RS103,Radiated Susceptibility compliance will be met using a combination of actual testing and RF Analyses. Radiated susceptibility testing will done from 30 MHz to 18 GHz at the 20 V/m level. Radiated susceptibility analysis will be done first from 14 kHz to 40 GHz using Launch Survival levels and then to Performance levels from 30 MHz to 40 GHz.
3.0DESCRIPTION OF TEST SITE
The tests described herein will be performed at CKC Laboratories, Inc.,
1120 Fulton Place, Fremont, CA94539.
3.1Test Facilities
The CKC Laboratories, Inc. Fremont EMI Chambers to be used for the testing will either be the 16' x 16' x 10' high shielded enclosure or the 18’ x 32’ x10’ high shielded enclosure, both are designed to attenuate radio frequency noise over 80 dB up to 1 GHz, and over 60 dB at 18 GHz. The enclosure uses ferrite tiles with foam anechoic material in key areas to achieve uniform testing from 1 MHz to 40GHz. Power brought into the room is filtered over 100 dB for frequencies over 14 kHz. All emissions measurement equipment is operated from isolation transformers, which help eliminate the possibility of ground loops. All lighting in the laboratory is filtered to reduce electrical noise.
3.2Ground Plane
The ground plane in the chamber consists of a 3'3” x 12' x 0.020" thick copper sheet bonded to the shieldroom wall with 0.1 m of bonding resistance. The ground plane is bonded to the shielded enclosure at a minimum of once every 30 inches using copper bonding straps with a length to width ratio of 5:1.
3.3Mounting and Bonding
ThePDU will be bonded to the ground plane via the PDU Test Stand. The grounding will be identical to that used in the final installation. DC bonding resistance measurements will be made on accessory items (if any) to assure that a bonding resistance of 2.5 milliohms (maximum) is achieved.
3.4Test Facility Radiated and Conducted Emission Profile
The ambient electromagnetic emission profile within the shielded enclosure should be at least 6 dB below the tailored GLAST program limits when using the MIL-STD-461E bandwidths and dwell times in Table 3-2. This condition will be verified by performance of an ambient radiated interference measurement prior to testing. If the bandwidth or measurement time differs from Table 3-2, record the bandwidth and measurement time in the Test Log.
The two shielded cables, originating from the PDU support equipment located outside of the chamber will have their shields referenced to the chamber wall and have 360 degree contact with the chamber wall at the bulkhead entry point. This will prevent any superfluous signals from getting into the test chamber.
3.5Test Instrumentation Isolation
All test instrumentation will be isolated from the equipment under test through the use of isolation transformers. All test chamber penetrations will be referenced to the chamber via 360 degree contact.
3.6General Emission Testing Requirements
During emission testing, the emissions measuring equipment shall use the MIL-STD-461E bandwidths and dwell times in Table 3-2; however, lower bandwidths shall be used if the noise floor is not at least 6 dB below the test requirements for the tailored GLAST program limits. All emissions detected during the PDU testing shall be measured with the specified bandwidths shown in Table 3-2 and compared against the limits required by the GLAST program. If the bandwidth or measurement time differs from Table 3-2, record the bandwidth and measurement time in the Test Log.
TABLE 3-2
Bandwidth and measurement time
FrequencyRange / 6 dB Bandwidth / Dwell Time / Minimum Measurement Time Analog Measurement Receiver30 Hz – 1 kHz / 10 Hz / 0.15 sec / 0.015 sec/Hz
1 kHz – 10 kHz / 100 Hz / 0.015 sec / 0.15 sec/kHz
10kHz – 150 kHz / 1 kHz / 0.015 sec / 0.015 sec/kHz
150 kHz – 30 MHz / 10 kHz / 0.015 sec / 1.5 sec/MHz
30 MHz – 1 GHz / 100 kHz / 0.015 sec / 0.15 sec/MHz
Above 1 GHz / 1 MHz / 0.015 sec / 15 sec/GHz
3.7General Susceptibility Testing Requirements
During susceptibility testing, the test signal source shall be limited to the scan rates specified in Table 3-3 with the exception of RS103 testing above 1 GHz, where the scanning rates will double and the dwell time reduced to 1 second.
RS103 Radiated Susceptibility assessment will be performed using a combination of RF analysis and RF testing. The PDU will be Radiated Susceptibility testing using MIL-STD-461E procedures from 14 kHz to 18 GHz using field strength of 20 V/m.
RF analysis will be performed from 14 kHz to 40 GHz using the Launch levels and assuming the system is powered off during the application of the following field strengths:
14 kHz to 1 GHz20 V/m
1GHz to 5 GHz75 V/m
5 GHz to 6 GHz150 V/m
6 GHz to 40 GHz42 V/m
RF analysis will then be performed from 14 kHz to 40 GHz using the Performance levels and assuming the system is powered on during the application of the following field strengths:
14 kHz to 2.2825 GHz20 V/m
2.2825 GHz to 2.2925 GHz38 V/m
2.2925 GHz to 14.9634 GHz20 V/m
14.9634 GHz to15.0434 GHz42 V/m
15.0434 GHz to 40 GHz20 V/m
When the test results indicate a susceptibility condition with the PDU as defined in accordance with paragraph 6.3, the threshold level at which the susceptibility condition no longer exists shall be determined and recorded. The threshold level shall be determined by reducing the test interference signal until the PDU no longer exhibits evidence of being susceptible to the signal and then gradually increasing the level of the interference signal until the susceptible condition just recurs. The level of the interference signal and the frequency range of susceptibility shall be recorded before proceeding with any further testing.
TABLE 3-3
Susceptibility scanning
FrequencyRange / Analog ScansMaximum Scan Rates / Stepped Scans
Maximum Step Size
30 Hz – 1 MHz / 0.0333f0/sec / 0.05 f0
1 MHz – 30 MHz / 0.00667 f0/sec / 0.01 f0
30 MHz – 1 GHz / 0.00333 f0/sec / 0.005 f0
1 GHz – 8 GHz / 0.000667 f0/sec / 0.001 f0
8 GHz – 40 GHz / 0.000333 f0/sec / 0.0005 f0
TABLE 3-4
RS103 Radiated Susceptibility Test Levels & Modulations
FrequencyRange / Signal Type / Modulation / Field (Peak)Test
30 kHz - 18 GHz / PM / 50%, 1kHz / 20 V/m
4.0TEST INSTRUMENTATION
4.1The test instrumentation listed in each individual test in Section 7 is representative of the equipment required for the tests described herein. Other test equipment may be substituted for the equipment listed herein as long as the equipment is able to accurately perform the required function. All substitute test equipment will be noted in the test log.
4.2The EMC test report must contain a full description of the equipment actually used including the manufacturer, model number, serial number, and calibration due date. Any equipment which requires periodic calibration will be in a current calibration cycle at the time of the test. The calibration certification will be traceable to the National Bureau of Standards and will be in accordance with MIL-STD-45662.
4.3Antenna Factors and Current Probe Characteristics
This section provides the antenna factors and current probe transfer functions for emission tests described herein.
4.3.1Antenna Factors
Figures 4-2, 4-3, 4-4, and 4-5 give representative antenna factors of the 3301 EMCO active rod antenna, the SAS200/540 A-H Systems’ biconical antenna, the ARA’s 3115 Double ridge guide horn antenna, and the SAS 570 A-H Systems’ Double ridge guide horn antenna.
The antenna factors given are typical, and the actual antenna factors, serial numbers and calibration dates of the antennas used will be contained in the test report and this is true of the current probe also.
The antenna factors of the horn antennas are constant over the operating frequency range of the horn, and are as follows:
Antenna Type / FrequencyGHz / Antenna Factor
dB/m
DRG 1020/B / 1 - 2 / 19.2
MWH 24/A / 2 - 4 / 25.2
MWH 3349 / 3.6 - 5 / 30.3
DRG 5018 / 5 - 18 / 33.2
DRG 118 / 1 – 18 / 30.3
4.3.2Loop Sensor Factors
The F-303 loop sensor has factors that are added to the readings of the spectrum analyzer to convert to dB pT. These correction factors are shown in Figure 4-6.
4.3.3Current Probe Factors
The Fischer Models F-12 and F-35 current probe will be used for all conducted emission tests described herein. The transfer impedance of this probe is shown in Figure 47 and Figure 4-8.
4.3.410 μF Feedthrough Capacitors
Solar 6512-10GR 10 F feedthrough capacitors will be used to decouple and establish a low common mode impedance reference for all ungrounded power leads that require testing. The typical impedance vs. frequency characteristics of this type of capacitor is plotted in Figure 4-1. The 10 F feed-through capacitor impedance is calculated using the measured insertion loss in dB, by the following equation:
Z = 50 x 10-(dB/20)
Figure 4-1: 10F Feedthrough Capacitor, Insertion Loss
FrequencyAntenna Factor
MHz dB/m _
.014.25
.02 .25
.03 .25
.04 .25
.05 .2
.06.1
.07 .2
.08.25
.09 .1
.1 .1
.2 .1
.3 .1
.4 0
.5 0
.6 0
.7 .2
.8 .1
.9 .1
1.0 .1
1.5 .2
2.0 .25
3.0 .75
4.0 .75
5.0 1.25
6.0 1.2
7.0 1.2
8.0 1.6
9.0 1.6
10.0 1.8
15.0 2.25
20.0 2.7
25.0 3.5
30.0 4.25
The above antenna factors are added to the spectrum analyzer meter reading in dBV to obtain the corrected field intensity reading in dBV/m or dBV/m/MHz.
Figure 4-2: Antenna Factors, Active Rod, EMCO 3301
FrequencyAntenna Factor
MHz dB/m _
20.0 18.0
25.0 15.7
30.0 14.5
35.0 12.2
40.0 12.1
45.0 11.2
50.0 10.0
60.0 9.5
70.0 9.3
80.0 9.6
90.0 9.7
100.0 10.3
110.0 11.1
120.0 11.3
130.0 12.1
140.0 12.2
150.0 12.8
160.0 13.3
170.0 13.6
180.0 14.4
190.0 14.7
200.0 14.3
The above antenna factors are added to the spectrum analyzer meter reading in dBV to obtain the corrected field intensity reading in dBV/m or dBV/m/MHz.
Figure 4-3: Antenna Factors, Biconical, A-H Systems SAS200/540
Frequencyin (MHz) / Antenna
Factor (dB)
1000 / 26.27
1500 / 24.85
2000 / 28.75
2500 / 28.62
3000 / 30.36
3500 / 31.19
4000 / 31.77
4500 / 33.74
5000 / 34.18
5500 / 34.6
6000 / 33.82
6500 / 34.95
7000 / 36.98
7500 / 37.96
8000 / 38.06
8500 / 38.42
9000 / 37.5
9500 / 38.88
10000 / 41.47
10500 / 41.25
11000 / 40.71
11500 / 39.82
12000 / 40.1
13000 / 39.61
14000 / 41.76
15000 / 42.67
16000 / 40.08
17000 / 39.42
18000 / 38.85
The above antenna factors are added to the spectrum analyzer meter reading in dBV to obtain the corrected field intensity reading in dBV/m or dBV/m/MHz.
Figure 4-4: ARA 3115 Antenna Factors
Frequencyin (MHz) / Amplitude
in (dB)
0.00003 / 83
0.00006 / 80
0.0001 / 69.3
0.0005 / 56.3
0.001 / 49
0.005 / 37.1
0.01 / 31.9
0.05 / 24.7
0.1 / 25.7
The above antenna factors are added to the spectrum analyzer meter reading in dBV to obtain the corrected field intensity reading in dBV/m or dBV/m/MHz.
Figure 4-5: SAS-570 Horn Antenna Factors
Freq in (MHz) / Amplitude in (dB)0.00003 / 83
0.00006 / 80
0.0001 / 69.3
0.0005 / 56.3
0.001 / 49
0.005 / 37.1
0.01 / 31.9
0.05 / 24.7
0.1 / 25.7
These factors are added to the readings on the spectrum analyzer to convert to different units such as dBpT.
Figure 4-6: F-303 Loop Sensor Factors
FrequencyCorrection Factor
MHz in dB
.01 -19.0
.02 -13.0
.03 -9.5
.04 -7.0
.05 -6.5
.06 -4.5
.07 -3.0
.08 -2.5
.09 -2.0
.1 -1.5
.2 1.0
.3 1.0
.4 1.0
.5 1.0
.6 1.0
.7 1.0
.8 1.0
.9 1.0
1.0 1.0
2.0 1.0
3.0 1.0
4.0 1.0
5.0 1.0
6.0 1.0
7.0 1.0
8.0 1.0
9.0 1.0
10.0 1.0
20.0 1.0
30.0 1.0
40.0 1.0
50.0 1.0
60.0 1.0
70.0 1.0
80.0 1.0
90.0 1.0
100.0 3.0
The above correction factors are subtracted from the spectrum analyzer meter reading in dBV to obtain the corrected current in dBA. For frequencies lower than those shown above the correction factor is given by -59 + 20 Log (f/100), where f is the frequency of measurement in hertz.
Figure 4-7: Current Probe, Transfer Impedance,