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ENVIRONMENTAL STRESS SCREENING

TABLE OF CONTENTS

CHAPTER 1– INTRODUCTION.…………………………………...... 1

1.1– WHY ESS?………………………………………………………...... 1

1.2– HOW ESS WORKS?…………………………………………...... 3

1.3– WHAT THIS BOOK OFFERS?…………………………………...... 6

CHAPTER 2– HISTORICAL PERSPECTIVE OF ESS.……………...... 15

CHAPTER 3– ESS DEFINITIONS, BASIC CONCEPTS AND

COMMON MISCONCEPTIONS……………………...... 21

3.1– WHAT IS ESS?……………………………………………...... ……21

3.2– DEFINITIONS AND ACRONYMS OF FREQUENTLY

USED TERMS IN ESS…………………………………...... ………..22

3.3– COMMON MISCONCEPTIONS ABOUT ESS………...... …………53

CHAPTER 4– ESS TYPES AND THEIR

EFFECTIVENESS………………………...... ……………...61

4.1– FLAW-STIMULUS RELATIONSHIPS…………...... …………….61

4.2– ESS TYPES…………………………………………...... ……………66

4.3– SCREEN PARAMETERS…………………………...... …………..73

4.4– POPULARITY AND EFFECTIVENESS OF

ESS TYPES………………………………………...... ………………75

4.5– ADVANTAGES OF TEMPERATURE CYCLING…...... …………..78

CHAPTER 5– ESS STANDARDS AND DOCUMENTS FOR

ELECTRONIC ASSEMBLIES……...... …………………...81

5.1– BACKGROUND……………………………………...... ……………81

5.2– AN UPDATED OVERVIEW………………………...... ……………82

CHAPTER 6– THE STATISTICAL QUANTIFICATION

AND OPTIMIZATION OF ESS…………...... ……………..93

6.1– INTRODUCTION……………………………………...... …………..93

6.2– ASSUMPTIONS……………………………………...... ……………94

6.3– PART LEVEL SCREENING………………………...... …………….95

6.4– SYSTEM LEVEL SCREENING………………………...... ……….107

6.5– TWO-LEVEL SCREENING: THE LIFE-CYCLE

COST MODEL………………………………………...... …………118

6.6– BAYESIAN APPROACH TO ESS…...... …………………………..134

6.7– COMMENTS…………………………...... ………………………...148

CHAPTER 7– PHYSICAL QUANTIFICATION OF ESS BY

THERMAL CYCLING……...... …………………………..167

7.1– THE ARRHENIUS MODEL AND ITS PITFALLS……...... ……...167

7.2– MODIFICATION AND PARAMETER ESTIMATION

OF THE ACCELERATION FACTOR EQUATION…...... ………..172

7.3– TEMPERATURE PROFILE AND THE MODEL

FOR THE ACCELERATION FACTOR……………...... ………….176

7.4– EQUIVALENT ACCELERATION FACTOR EVALUATION

USING EQ. (7.26)…………………………………...... ……………180

7.5– EQUIVALENT ACCELERATION FACTOR

EVALUATION USING EQ. (7.27)………………...... …………….184

7.6– APPLICATION OF THE AGING ACCELERATION

MODELS……………………………………………...... ………….189

7.7– OPTIMUM NUMBER OF THERMAL CYCLES FOR A

SPECIFIED FIELD MTBF GOAL……………………...... …………..193

7.8– A SUMMARY OF SOME USEFUL THERMAL

FATIGUE LIFE PREDICTION MODELS FOR
ELECTRONIC EQUIPMENT……………………...... …………….197

7.9– CONCLUSIONS……………………………………...... …………..205

CHAPTER 8– PHYSICAL QUANTIFICATION AND

OPTIMIZATION OF ESS BY RANDOM

VIBRATION…………...... ………………………………..215

8.1– INTRODUCTION……………...... …………………………………215

8.2– FUNDAMENTAL THEORY OF A RANDOM

PROCESS…………………...... …………………………………….216

8.3– FAILURE DUE TO RANDOM VIBRATION AND

STRUCTURAL RELIABILITY EVALUATION……...... ………...246

8.4– OBTAIN THE STRESS RESPONSE PSD FUNCTION

FROM FINITE ELEMENT ANALYSIS………………...... ………291

CHAPTER 9– ESS BY COMBINED ENVIRONMENTS

THERMAL CYCLING AND RANDOM

VIBRATION………………...... ………………………….295

9.1– INTRODUCTION………………………...... ………………………295

9.2– THE THERMAL FATIGUE LIFE MODEL……...... ……………...297

9.3– THE RANDOM VIBRATION FATIGUE LIFE

MODEL………………………………………...... …………………298

9.4– COMBINED RELIABILITY ANALYSIS……...... ………………..299

9.5– OPTIMUM SCREENING STRATEGY………...... ………………..302

CHAPTER 10– ESS BY APPLYING MULTIPLE

STRESSES……………………...... ……………………..311

10.1– AGING ACCELERATION UNDER MULTIPLE

STRESSES-A TEST ON THE EFFECT DEPENDENCY

OF COMBINED STRESSES…………...... ……………………….311

10.2– AN ECONOMIC MODEL FOR OPTIMUM STRESS

REGIMEN DETERMINATION FOR A

MULTIPLE-STRESS ASSEMBLY-LEVEL

STRESS SCREEN.……………………...... ……………………….316

10.3– COMMENTS…………………………...... ……………………….323

CHAPTER 11– SCREENING STRENGTH AND THE RELATED

EMPIRICAL EQUATIONS IN ESS……...... …………...325

11.1– DEFINITION OF SCREENING STRENGTH………...... ………..325

11.2– SCREENING STRENGTH UNDER DIFFERENT

SCREENING STRESSES…………………………...... …………..325

11.3– AVERAGE DEFECT FAILURE RATE ESTIMATION

UNDER DIFFERENT SCREENING STRESSES…...... ………….330

11.4– MODEL APPLICABILITY…………………………...... ………...337

CHAPTER 12– ESS PLANNING…………………………...... …………..369

12.1– INTRODUCTION……………………………………...... ………..369

12.2– ESTABLISHMENT OF THE REMAINING DEFECT

DENSITY OBJECTIVES……………………………...... ………...370

12.3– INCOMING DEFECT DENSITY ESTIMATION…...... …………374

12.4– SCREENING PARAMETER SELECTION…………...... ………..387

12.5– SCREENING STRENGTH…………………………...... …………398

12.6– TEST DETECTION EFFICIENCY…………………...... ………...401

12.7– TEST STRENGTH………………………………...... …………….401

12.8– PROCEDURE FOR QUANTIFICATION

SELECTION……………………………………...... ……………...403

12.9– ECONOMIC OPTIMIZATION OF ESS PLANNING…...... ……..404

CHAPTER 13– TAILORING TECHNIQUE IN ESS………...... …………407

13.1– THE MECHANICS OF TAILORING…………………...... ……...407

13.2– STRESS RESPONSE SURVEY………………………...... ………408

13.3– TAILORING OF ENVIRONMENTAL STRESSES…...... ……….409

CHAPTER 14– MONITORING, CONTROL AND

EVALUATION OF ESS………………………………………………415

14.1– INTRODUCTION………………………………………...... …….415

14.2– DATA COLLECTION AND FAILURE

CLASSIFICATION………...... ……………………………………415

14.3– MONITORING AND CONTROL IN THE SCREENING

PROCESS…………………...... …………………………………...417

14.4– EVALUATION FOR THE SCREENING PROCESS……...... …...422

CHAPTER 15– AN APPLICATION OF DOD-HDBK-344 IN

DEVELOPING A CLOSED-LOOP DYNAMIC

ESS PROGRAM…...... …………………………………...425

15.1– INTRODUCTION……………...... ………………………………..425

15.2– PRODUCT DESCRIPTION………...... …………………………..425

15.3– CLOSED-LOOP ESS PROCESS.…...... ………………………….426

15.4– INCOMING DEFECT PREDICTION…...... ……………………..426

15.5– SCREENING SELECTION AND PLACEMENT…...... …………428

15.6– DATA COLLECTION……………………………...... …………...432

15.7– DATA ANALYSIS AND PROCESS MONITORING…...... …….435

15.8– FAILURE CAUSE INVESTIGATION AND

CORRECTIVE ACTIONS……………………………...... ……….437

15.9– CONCLUSIONS……………………………………...... …………438

CHAPTER 16– ESS CASE HISTORIES……………...... ………………...439

16.1– ESS IN THE APOLLO SPACE PROGRAM…...... ……………….439

16.2– ESS ON NEW PRINTERS IN IBM……………...... ……………...439

16.3– ESS ON SWITCHING LOGIC UNITS AT

LOCKHEED…………………………………...... ………………...441

16.4– AMERICAN AIRLINES ESS DEMONSTRATION……...... …….441

16.5– POWER SUPPLY RANDOM VIBRATION STRESS

SCREENING AT ZYTEC………………………………...... ……..441

16.6– THERMAL CYCLING SCREENING OF A

SPACECRAFT AT HUGHES…………………………...... ………446

16.7– ESS ON SHIPBOARD MILITARIZED DIGITAL

COMPUTER…………………………………………...... ………...447

16.8– RANDOM VIBRATION OF AN AIRBORNE DIGITAL

COMPUTER……………………………………………...... ……...447

16.9– RANDOM VIBRATION SCREEN OF AN ADVANCED

SIGNAL PROCESSOR…………………………………...... ……..448

16.10– THERMAL CYCLING SCREENING ON AIRBORNE

RADAR MODULE……………………………………...... ……..450

16.11– STRIFE TEST PROGRAM IN

HEWLETT-PACKARD……………………………...... ………...451

16.12– STRIFE TESTING AT ZYTEC HELPS THE

COMPANY WIN BALDRIGE………………………...... ………454

16.13– COST EFFECTIVENESS OF ESS DEMONSTRATED

AT ROBINS AIR FORCE BASE……………………...... ………458

16.14– RANDOM VIBRATION SCREENING OF

MILITARIZED AVIONIC COMPUTERS AT IBM…...... ……..459

16.15– ESS OF A HIGH-DENSITY SURFACE MOUNT

CIRCUIT CARD AT AT&T LITTLE ROCK…………...... …….462

16.16 – AUTOMATED ESS OPTIMIZATION FOR U.S.

ARMY ELECTRONIC HARDWARE………………...... ………467

16.17– ESS AS APPLIED TO A NEW COMPUTER…………...... …….474

INDEX…………………………………………………………...... ……....493

ABOUT THE AUTHORS……………………………………...... ………..514