Jiangtao Qu1, Limei Yang2, Simon Ringer2, Rongkun Zheng1

A Simple Approach of Specimen Preparation with Normal/High Density Nanowires for Atom Probe Microscopy

Jiangtao Qu1, Limei Yang2, Simon Ringer2, Rongkun Zheng1

1School of Physics, The University of Sydney, New South Wales, Australia 2006;

2Australian Centre for Microscopy & Microanalysis. The University of Sydney, New South Wales, Australia2006;

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III-V group nanowires are considered as the building block for next general electronic devices. However, beforesuccessful commercial applications in wide range, it is essential to control their synthesis process and associate their properties (such as electrical, magnetic, mechanical properties) with their intrinsic features (Crystallography, composition, doping and morphology etc.) by characterization technology.

Atom Probe Microscopy(APM), providing atomic-scale information on both position and composition, is believed to be one of the most effective instruments to characterize the nanowires; however, specimen preparation on this material is still a challenging job. An effective specimen preparation with low-density nanowires for APM has been proposed in our previous study [1]; here, we present a simple way of normal/high density nanowire specimen preparation through lifting out process.

Blade will be firstly used to collect free-standing nanowires from their grown substrates; thereafter, nanowires solution will be prepared by sonication of the ethanol used for removing nanowire from blade;then drip the solution on a copper grid with holy carbon film. The nanowires will be trapped by carbon film and ready for lifting out by a manipulator in SEM. Finally, bend the manipulator until NW has a good orientation for APM. This method is highly feasible and controllable for normal and high density NWs specimen preparation. The whole procedure is illustrated in figure.1.

Fig.1 (a) dispersing nanowires on copper grid; (b) lifting-out nanowires; (c) bending the manipulator for correct orientation; (d) Specimen alignment with aperture in APM

The authors acknowledge the facilities, and the scientific and technical assistance, of the Australian Microscopy & Microanalysis Research Facility at the University of Sydney.

References

[1]S. Du, T. Burgess, S. T. Loi, B. Gault, Q. Gao, P. Bao, et al.,Ultramicroscopy, 124, 96 (2013).