Advanced Call for Papers

Advanced Call For Papers

NEPCON East/Electro 2002, June 10 –12, 2002, at the Boston, MA Bayside Exhibition Center, is an annual conference that has gathered the Electronics Industry together to share new technologies, discuss innovative applications, and exhibit products and services for the production and testing of electronic subsystems and products.

The IEEE Electro Technical Program committee, in partnership with the American Society of Test Engineers, Inc. (ASTE, www.astetest.org) is looking for high quality technical papers oriented towards an appropriate topic dealing with Test philosophies and strategies in general, and Automatic Test technology in particular. Abstracts for technical papers are now being solicited, as are proposals for the Technical Sessions.

TOPICS & AREAS OF INTEREST

Authors should focus on topics that discuss test in the following areas:

Reed Exhibition Companies (www.nepcon.com) The American Society of Test Engineers, Inc.

383 Main Avenue (ASTE, www.astetest.org )

Norwalk, CT P.O. Box 389

Tel: +1 203 840 5857 Nutting Lake, MA 01865-0389

E-Mail:

·  Test Requirements Definition and Verification

·  Military Testing

·  Modeling and Simulation

·  Design-For-Test

·  New Test Innovations

·  Wireless Communications Test

·  Hardware & Software Trends

·  Next Generation Test Systems

·  Optical Network Systems Test

·  Integrated Diagnostics

·  Test Programming Methods & Tools

·  Artificial Intelligence in Test

·  Test Strategies

·  Software Tools

·  Alternative Test Methods

·  Software Testing

·  VXI, PXI, etc.

·  Testing Standards

Reed Exhibition Companies (www.nepcon.com) The American Society of Test Engineers, Inc.

383 Main Avenue (ASTE, www.astetest.org )

Norwalk, CT P.O. Box 389

Tel: +1 203 840 5857 Nutting Lake, MA 01865-0389

E-Mail:

Authors should submit abstracts, which should be approximately two to three paragraphs in length, highlighting the main features of the proposed paper and discuss the innovative aspects of the work. Session Proposals should include proposal papers/presentations, and potential speakers. The closing date for receipt of session proposals and paper abstracts is March 15, 2002.

An author's kit with guidelines, formatting instructions, and copyright forms are now available in MS Word format. Contact Cristina Cotto at Reed Exhibition Companies (Phone - 203-840-5857 or e-mail ) for a copy.

Reed Exhibition Companies (www.nepcon.com) The American Society of Test Engineers, Inc.

383 Main Avenue (ASTE, www.astetest.org )

Norwalk, CT P.O. Box 389

Tel: +1 203 840 5857 Nutting Lake, MA 01865-0389

E-Mail:

Reed Exhibition Companies (www.nepcon.com) The American Society of Test Engineers, Inc.

383 Main Avenue (ASTE, www.astetest.org )

Norwalk, CT P.O. Box 389

Tel: +1 203 840 5857 Nutting Lake, MA 01865-0389

E-Mail: