Template and guidelines for a JSPS abstract:
Title should be centered in Arial 12 font, boldface

Mustafa F. Doe 1, a, Jeffrey W.J. Clinton2, Jim-Goo Park2
and Louise M. Claes3

1 Affiliation and Full address of first author, including country (10pt arial)

2 Affiliation and Full address of second author, including country

3 List all distinct addresses in the same way

email of corresponding author

Introduction

This document explains how to prepare your camera-ready article to be included in the abstract book of the JSPS2015 workshop.

It is recommended to take this document as a template. All manuscripts must be in English and text must be in black/white only. Color figures or photographs are allowed.

General typesetting rules

Page Layout. The text area for your manuscript must be 17 cm wide and 25 cm high (6.7 by 9.8 inches). Do not place any text outside this area. Use A4 size (21´29.7 cm) document setting and page setting. The total article length should preferentially not exceed 2 pages.

Text formatting. Use a justified 12pt Times New Roman font for the body text. Use italic for emphasizing a word or phrase. Do not use boldface typing or capital letters except for section headings (cf. remarks on section headings, below).

Section Headings. The section headings are in 12pt boldface capital and lowercase letters. Second level headings are typed as part of the succeeding paragraph (like the subsection heading of this paragraph) in a 12pt Times New Roman boldface. There should be no third level headings.

Page Numbers. Do not print page numbers.

Literature References

References are cited in the text by square brackets [1].

References

[1] AIP Style Manual, 4th ed. (The American Institute of Physics, 1997).

(see e.g.: http://www.aip.org/pubservs/style.html).

[2] D.M. Maric, P.F. Meier and S.K. Estreicher: Mater. Sci. Forum 83-87 (1992), p. 119.

[3] M.A. Green: High Efficiency Silicon Solar Cells (Trans Tech Publications, Switzerland, 1987).

Figure 1: Residual contamination after two spin cleaning processes.

Table I: Overview of W0(sr) for SiO2 particles using oblique illumination in combination with the wide and narrow detectors of SP1.

Detector / Si substrate / Si3N4 substrate
Wide / 0.8 ± 0.3 / 1.6 ± 0.3
Narrow / 0.31 ± 0.03 / 1.8 ± 0.4

Figure 2: Residual Es contamination as function of Es bulk concentration and pH for two cleaning techniques.