TII/TAD Meeting
/ April 24-26, 2012Houston, TX
Attendees: / 4/24
/ 4/25 / 4/26
Anthony Alwardt / The Boeing Company / / / /
Ryan Boleman / Analysis, Integration & Design Inc. (AIDI) / / / /
Malcolm Brown / UK Ministry of Defence / / / /
Matt Cornish / Cassidian / / / /
Phong Do / USAF Robins AFB / / / /
Chris Gorringe / Cassidian / / / /
Anand Jain / National Instruments / / /
Carey Jimmerson / US ARMY-AMRDEC / /
Chatwin Lansdowne / NASA / / / /
Teresa Lopes / Teradyne / / / /
David Milligan / United States Air Force (Robins AFB) / / /
Scott Misha / U.S. Army / / / /
Ion Neag / Reston Software, LLC / / / /
Mike Seavey / Northrop Grumman / / / /
Ron Taylor / Summit Test Solutions / / / /
Tim Winquist / Analysis, Integration & Design Inc. (AIDI) / / / /
Lisa Yacone / IEEE-SA / / /
Agenda item: / TAD/TII Subcommittees Joint Meeting
Discussion:
There was a joint meeting of the above two subcommittees to schedule membership and activities for the SCC20 annual report. The group(s) outlined key milestones and dates for the respective standards and planned meetings over the coming year.
Agenda item: / TAD Subcommittee
Discussion:
· The P1641.1 User Guide Working Group met and unanimously agreed to submit the latest Draft for Ballot
· The TAD subcommittee reviewed the UUT Description and Test Description schemas and issues. All outstanding issues related to moving elements and types from Test Description to UUT Descriptions were resolved. The following schema changes were made:
· Changed UUT/Description/DescriptionDocumentReference to use common type c:DocumentReference. Cleaned up all references to external documents and to items defined in external documents.
· Element UUT/Category was tentatively removed. Decided to add it back, in the UUT Description schema.
· Added Extension element to UUT/TestData.
· Under InterfaceRequirements/Fixtures, replaced type TestAdapterDescription with ItemDescription, while keeping the reference to the TestAdapter schema. In the Annotation for Fixtures, will indicate that using a TestAdapterDescription-derived type allows the description of Fixture Interfaces, for cases when the Test Description must reference Fixture Ports (ex. with active Fixtures).
· Deleted element InterfaceRequirements/SignalConditioning. Added text in annotation of Fixtures, indicating that the elements can describe signal conditioning circuitry.
· Decided to add back referential integrity constraints under root element, which will allow us to move several elements out of DetailedTestInformation.
· Decided to move Component definitions from under FailureFaultData to UUT, because their purpose is not limited to fault description. Or move the entire FaultFailureData element to UUT.
· Decided to move Range & Nominal value to PinFunction in In UUT Description (we will decide if it is useful after adding support for Capabilities).
· Discussed design for DetailedTestInformation/FaultFailureData/Components. To describe Component interfaces, will use type UUTComponent (derived from c:ItemDescription); will assign to HardwareUut/Components/Component/Definition. Will Remove Component definition from Test Description; always use the one from UUT Description.
· The development of revised versions for the UUT Description and Test Description schemas will continue separately.
Agenda item: / TII Subcommittee
Discussion:
· P1671.4 Test Configuration was discussed and identified as ready to go to ballot, once the annotations are aligned.
· P1671.2 Instrument Description. The final amended revision was reviewed and cross checked and analogously agreed to initiate the ballot process
· P1671.5 Test Adaptor. The final amended revision was reviewed and cross checked and analogously agreed to initiate the ballot process
· P1671.6 Test Station Descriptor. The final amended revision was reviewed and cross checked and analogously agreed to initiate the ballot process
· Note: the number of SCC20 standards awaiting to enter ballot is recognised as significant. Decision to liaise with SCC20 chair and sub-committee co-chair
· P1871.1 Inaugural meeting of the ATML Synthetic Instrument, volunteers identified.
· P1871.2 Inaugural meeting of the Intrinsic Paths. Reviewed requirements and discussed possible ATML solutions and methodologies ofr adding in extra required information.
· P1671.0 User Guide – Further discussion on units and ranges and using Ontology’s for helping to share ATML models.
· Action outline topics by next meeting representing already published material.
Agenda item: / Next Meeting / Presenter: / Chris Gorringe
Discussion:
The SCC-20 TII/TAD Working Group Meeting
September 8, 2012
Disneyland Hotel in conjuction with AUTOTESTCON 2012
Anheim, CA