Standard Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

Requirements Specification

April 26, 2005

Contents

Standard Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

1Introduction......

1.1Purpose......

1.2Scope......

1.3Reason......

1.4Goals......

2REQUIREMENTS......

TII ATML RequirementsPage 1 of 4

Issue 1.01April 26, 2005

1Introduction

1.1Purpose

The purpose of ATML is to support test program, test asset and Unit Under Test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidance for usage of the ATML family of standards.

1.2Scope

ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the extensible markup language (XML). This document specifies the architecture for the family of ATML standards.

1.3Reason

The ATML initiative is driven by a desire to standardize the XML format for use by various proprietary tools used within the automatic test industry. This will benefit both automatic (computer controlled) test equipment manufactures, maintainers and test system users in a broad range of industries including aerospace and government/military. By using a common format different tools and systems can exchange information, and form co-operative heterogeneous systems resulting in: Decreased test times, Reduced incidents of Can Not Duplicate or No Fault Found, Reduced Repair Cycle, Formalized capture of historic data, and improved Closed loop diagnostic systems.

1.4Goals

  • Establish an industry standard for test information exchange
  • Allow for managed extensibility
  • Ensure compatibility with other standards
  • Allow for legacy systems
  • Create modular descriptions for Test Environments
  • Leverage existing technologies
  • Allow for the use of dynamic test sequences that can change with historical data
  • Allow for the use of optimization techniques such as Artificial Intelligence
  • Facilitate description of both instrument control and signal level control
  • Facilitate description of parallel/simultaneous testing and complex timing relationships

2REQUIREMENTS

  1. Support generation of test diagrams.
  2. Allow description of all routing and paths between Unit Under Test and resources.
  3. Support automated generation of Test Requirement Descriptionand Test Program.
  4. Support legacy programs written in ATLAS, LabView, LabWindows/CVI, Test Studio, Test Base, etc.
  5. Support generation of Master Test Program Set Index (MTPSI).
  6. Support storage of test results. Including user inputs and system output reported to operator.
  7. Support use of diagnostic data.
  8. Support description of Interface Adapter connectivity including cables, fixtures, connectors, and components.
  9. Support description of signal generation, measurement, and switching by an instrument.
  10. Support description of ATE system. Including I/O buses and bus address of instruments.
  11. Support parallel testing.
  12. Support fault trees and fault tables.
  13. Allow test data for multiple runs during a single session to be reported in a single document.
  14. Support building block approach to signal modeling.
  15. Support both signal parameters and waveform characteristics definitions.
  16. Support description of wiring (multi connection, wire size, etc).
  17. Support trigger, signals and events.
  18. Provide for extensibility of ATML schemas.

TII ATML RequirementsPage 1 of 4

Issue 1.01April 26, 2005